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Imaging Unknown Sample with AFM

Page history last edited by Dmitry Sokolov 8 years, 7 months ago

AFM Imaging Factors  


 

  1. Estimate sample density on 10x10 um2 area or feature sizw per line width equal to tip radius. That will define probability of finding sample under microscope.
  2. Put sample on a coverslip.
  3. Image under compound light microscope with air objectives under 100-400x magnification. Estimate size distribution, uniformity of the sample over the coverslip. If possible, mark the area of optimum density or interest with a marker from bottom side. Estimate how well the sample is attached to the surface and how well it is fixed or immobilized. Only well fixed and immobilized samples can be imaged in contact mode.
  4. Attach the coverslip to the sample holder.
  5. Image the sample carefully:
    1. put scanning area to 0nm
    2. minimize the setpoint at approach
    3. check approaching the surface by increasing the setpoint. The Z position should stay same as at time of approach
    4. minimize the setpoint by going through loosing the contact and back to the contact 
    5. increase the scanning area carefully: 100nm-500nm-1um. At scanning a slope, withdraw the probe and offset into the area of potential apex. Offset can be done at scanning too but be very careful to avoid going out of the range of Z scanner. Stop at apex or at area of interest.
    6. Confirm scanning the surface but not water or uther instable layer. Reduce the setpoint at loose surface or increase setpoint to see more details.
  6. Adjust the scanning area and imaging conditions.
  7. In the case of unsuccessful imaging try to prepare sample for SEM and image the sample at higher magnification.
  8. Repeat careful imaging with AFM. 

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